Yearlong 500 °C Operational Demonstration of Up-scaled 4H-SiC JFET Integrated Circuits | Citedby Results | Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT)

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Yearlong 500 °C Operational Demonstration of Up-scaled 4H-SiC JFET Integrated Circuits

Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) (2018) 2018 (HiTEC): 000071–000078.

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