Skip Nav Destination
Sixty Earth-Days Test of a Prototype Pt/HTCC Alumina Package in Simulated Venus Environment
Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) (2018) 2018 (HiTEC): 000015–000021.
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
High-Throughput Apparatus for Semiconductor Device Characterization in a Magnetic Field at Extreme High Temperatures
- Hesham Okeil
- Gabriele Schrag
- Gerhard Wachutka
IEEE Transactions on Instrumentation and Measurement (2023) 72: 1.
- Daniel K. Schreiber
- Ruth Schwaiger
- Martin Heilmaier
- Scott J. McCormack
MRS Bulletin (2022) 47 (11): 1128.
Operational Testing of 4H-SiC JFET ICs for 60 Days Directly Exposed to Venus Surface Atmospheric Conditions
- Philip G. Neudeck
- Liangyu Chen
- Roger D. Meredith
- Dorothy Lukco
- David J. Spry
- Leah M. Nakley
- Gary W. Hunter
IEEE Journal of the Electron Devices Society (2019) 7: 100.