Whether the need is due to poorly bondable materials, non-flat bonding surfaces, odd packaging situations, or just the need for high reliability; the integrity of a wire bond interconnect can usually be greatly improved through the proper use of Auxiliary Wires. Auxiliary Wires are defined as Security Wires, Security Bumps, or Stand-Off Stitch (aka Stitch on Bump). The old stand-by Security Wire has been an asset for several decades, however, this is being replaced by Security Bumps which require a smaller second bond termination area. Further, Stand-Off Stitch (SOS) has many more applications and also has many side benefits that could be incorporated into a circuit design for better wire strength properties, fewer interconnects (die to die bonding), and lower loops. Stand-Off Stitch bonding involves the placement of a ball bump at one end of the wire interconnect, then placing a wire with another ball at the other end of the interconnect and stitching off the wire on the previous placed ball bump. This results in a near homogeneous stitch bond interconnect to the bump with an inherent improvement in stitch bond pull strength. Another use for SOS is Reverse Bonding (Stitch bond on bump on die bond pad) often resulting in a lower loop profile than standard forward wire loop and the loop is stronger because the wire hasn't been work annealed above the ball (in the Heat Affected Zone). A major impediment to the implementation of SOS is the retraining of visual inspectors and the approval of quality departments.
Skip Nav Destination
Article navigation
Research Article|
January 01 2010
Improved Bond reliability through the use of Auxiliary Wires (Security Bumps and Stand-Off Stitch)
David J Rasmussen;
Palomar Technologies, Inc, 2728 Loker Avenue West, Carlsbad, CA 92010
Phone: (800) 854-3467 E-mail: [email protected]
Search for other works by this author on:
Rodney Thompson
Goodrich Corporation, 14300 Judicial Road, Burnsville, MN 55306-4898
Phone: 952-892-4803 E-mail: [email protected]
Search for other works by this author on:
International Symposium on Microelectronics (2010) 2010 (1): 000474–000478.
Citation
David J Rasmussen, Rodney Thompson; Improved Bond reliability through the use of Auxiliary Wires (Security Bumps and Stand-Off Stitch). International Symposium on Microelectronics 1 January 2010; 2010 (1): 000474–000478. doi: https://doi.org/10.4071/isom-2010-WA4-Paper3
Download citation file:

507
Views
Citing articles via
Verification of Compartmental Electromagnetic Interference Shielding Effect with imprint-Through Mold Via (i-TMV) for RF modules
Motohiro Negishi, Tomoaki Shibata, Xinrong Li, Naoya Suzuki
Emergence of Glass Solutions for 5G and Heterogeneous Integration
Aric B. Shorey, Shelby F. Nelson, David Levy, Paul Ballentine
Fine-pitch Copper Pillar Flip Chips in High Reliability Applications
Catherine Farnum, Kaysar Rahim, Ph.D.
Highly accelerated lifetime testing in power electronics
Bernhard Czerny, Golta Khatibi
Implementation of Trusted Manufacturing & AI-based process optimization into microelectronic manufacturing research environments
K.-F. Becker, S. Voges, P. Fruehauf, M. Heimann, S. Nerreter, R. Blank, M. Erdmann, S. Gottwald, A. Hofmeister, M. Hesse, M. Thies, S. Mehrafsun, R. Fust, E. Beck, J. Pawlikowski, B. Schröder, C. Voight, T. Braun, M. Schneider-Ramelow