Fabrication of tall features using selective electrodeposition is well known process and has several applications in microelectronics packaging. The use of conventional exposure and development processes is limited by the aspect ratio and sizes of the features obtained. This paper describes a novel approach to fabricated tall structures featured in thick photoresist . Tin and copper tall structures were made by selective electrodeposition. Also presented are results from experiments performed to fabricate tall tin and copper pillars with nearly vertical walls on bare dices to form interconnect.

This content is only available as a PDF.