Contemporary statistically-based environmental test and evaluation techniques used to develop and qualify electronic systems will be too costly and time consuming for emerging equipment systems with much higher levels of reliability than current systems. The current emphasis on physical testing needs to be reduced and blended with the emerging analytical computerized tools to develop a more cost effective approach to evaluate the environmental suitability of electronic systems. It is proposed that an integrated approach based upon fracture mechanics concepts of latent defects growth and/or a nondestructive inspection techniques could yield such an approach.

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