The development of moisture standards is traced from the original Method 1018 (Internal Water Vapor Content) analytical laboratory certification program to the present. The results of several correlation experiments are presented, and the effect of time-temperature stress upon the stability of past and present standards is discussed. The current correlation experiment is detailed with respect to types of standards, experimental objectives, and design rationale. Preliminary data suggests possible modifications to Method 1018.2. Current efforts in this area are summarized. Semiconductor product moisture analysis data not only supports previously determined laboratory correlations but also positively establishes the success of Method 1018.2 in reducing the potential inclusion of moisture reliability hazards in military systems.

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