Abstract
In today's global environment, accelerated life testing (ALT) is becoming a competitive advantage when time spent from the conceptual stage to final product development needs to be minimized. Using ALT techniques for semiconductors and structural applications has substantial challenges when defining the thermal fatigue life-stress relationship to represent actual field performance. Helpful strategies to address such common problems using ALT are presented for faster ALT planning. Test examples from the refrigeration industry are used for this demonstration. The tests and analyses performed effectively increased the degree of reliability improvement and reduced the total number of test hours, resulting in a shorter design cycle.
© 2024
2024
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