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Donald Grant
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Journal Articles

Measurement of Particle Concentrations in Central Chemical Delivery Systems

Donald Grant
Journal: Journal of the IEST
Journal of the IEST (2006) 33 (4): 32–37.
https://doi.org/10.17764/jiet.2.33.4.q610040103872731
Published: 05 October 2006
View article titled, Measurement of Particle Concentrations in Central Chemical Delivery Systems
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Journal Articles

Design and Certification of High Purity Delivery Systems for Semiconductor Wafer Cleaning Chemicals

Donald Grant, Dan Smith, Peter Palm, Faa-Ching Wang, Danny Charest ...
Journal: Journal of the IEST
Journal of the IEST (2006) 37 (6): 32–40.
https://doi.org/10.17764/jiet.2.37.6.r62726744v254354
Published: 05 October 2006
View article titled, Design and Certification of High Purity Delivery Systems for Semiconductor Wafer Cleaning Chemicals
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Journal Articles

Quantitative Count Calibration of Light Scattering Particle Counters

Susan Peacock, Maura Accomazzo, Donald Grant
Journal: Journal of the IEST
Journal of the IEST (2006) 29 (4): 23–27.
https://doi.org/10.17764/jiet.1.29.4.l10046q32374413k
Published: 21 September 2006
View article titled, Quantitative Count Calibration of Light Scattering Particle Counters
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Journal Articles

Particle Capture Mechanisms in Gases and Liquids: An Analysis of Operative Mechanisms in Membrane/Fibrous Filters

Donald Grant, Benjamin Liu, Wayne Fisher, R. Bowling
Journal: Journal of the IEST
Journal of the IEST (2006) 32 (4): 43–51.
https://doi.org/10.17764/jiet.1.32.4.aq48094264312771
Published: 21 September 2006
View article titled, Particle Capture Mechanisms in Gases and Liquids: An Analysis of Operative Mechanisms in Membrane/Fibrous Filters
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Journal Articles

Improved Methodology for Determination of Submicron Particle Concentrations in Semiconductor Process Chemicals

Donald Grant, William Schmidt
Journal: Journal of the IEST
Journal of the IEST (2006) 30 (3): 28–33.
https://doi.org/10.17764/jiet.1.30.3.v1n1067443g65300
Published: 21 September 2006
View article titled, Improved Methodology for Determination of Submicron Particle Concentrations in Semiconductor Process Chemicals
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Journal Articles

Characteristics of Ultra-High Efficiency Membrane Filters in Gas Applications

Kenneth Rubow, Benjamin Liu, Donald Grant
Journal: Journal of the IEST
Journal of the IEST (2006) 31 (3): 26–30.
https://doi.org/10.17764/jiet.1.31.3.a20003860165wlj5
Published: 21 September 2006
View article titled, Characteristics of Ultra-High Efficiency Membrane Filters in Gas Applications
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Journal Articles

Measurement of Inorganic Contaminant Extraction from Fluid Handling Components By Dynamic Extraction

Donald Grant, Travis Lemke, Greg Duepner, Donna Wilkes, Norm Powell
Journal: Journal of the IEST
Journal of the IEST (2005) 39 (2): 29–37.
https://doi.org/10.17764/jiet.2.39.2.37v188215vww31lx
Published: 17 October 2005
View article titled, Measurement of Inorganic Contaminant Extraction from Fluid Handling Components By Dynamic Extraction
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Journal Articles

Optimization of Filter Properties for Recirculating Etch Baths

Wayne Kelly, Donald Grant, Joseph Zahka
Journal: Journal of the IEST
Journal of the IEST (2005) 43 (3): 30–40.
https://doi.org/10.17764/jiet.43.3.72574h1883p177u4
Published: 30 September 2005
View article titled, Optimization of Filter Properties for Recirculating Etch Baths
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