1-3 of 3
Reza Taleei
Close
Save search
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles

Modelling Cellular Response to Ionizing Radiation: Mechanistic, Semi-Mechanistic, and Phenomenological Approaches – A Historical Perspective

Available to Purchase
Reza Taleei, Shirin Rahmanian, Hooshang Nikjoo
Journal: Radiation Research
Radiat Res (2024) 202 (2): 143–160.
https://doi.org/10.1667/RADE-24-00019.1
Published: 25 June 2024
View articletitled, Modelling Cellular Response to Ionizing Radiation: Mechanistic, Semi-Mechanistic, and Phenomenological Approaches – A Historical Perspective
Open the PDF for Modelling Cellular Response to Ionizing Radiation: Mechanistic, Semi-Mechanistic, and Phenomenological Approaches – A Historical Perspective in another window
Includes: Supplementary data
Journal Articles

The Non-homologous End-Joining (NHEJ) Pathway for the Repair of DNA Double-Strand Breaks: I. A Mathematical Model

Available to Purchase
Reza Taleei, Hooshang Nikjoo
Journal: Radiation Research
Radiat Res (2013) 179 (5): 530–539.
https://doi.org/10.1667/RR3123.1
Published: 05 April 2013
View articletitled, The Non-homologous End-Joining (NHEJ) Pathway for the Repair of DNA Double-Strand Breaks: I. A Mathematical Model
Open the PDF for The Non-homologous End-Joining (NHEJ) Pathway for the Repair of DNA Double-Strand Breaks: I. A Mathematical Model in another window
Journal Articles

The Non-homologous End-Joining (NHEJ) Mathematical Model for the Repair of Double-Strand Breaks: II. Application to Damage Induced by Ultrasoft X Rays and Low-Energy Electrons

Available to Purchase
Reza Taleei, Peter M. Girard, Krishnaswami Sankaranarayanan, Hooshang Nikjoo
Journal: Radiation Research
Radiat Res (2013) 179 (5): 540–548.
https://doi.org/10.1667/RR3124.1
Published: 05 April 2013
View articletitled, The Non-homologous End-Joining (NHEJ) Mathematical Model for the Repair of Double-Strand Breaks: II. Application to Damage Induced by Ultrasoft X Rays and Low-Energy Electrons
Open the PDF for The Non-homologous End-Joining (NHEJ) Mathematical Model for the Repair of Double-Strand Breaks: II. Application to Damage Induced by Ultrasoft X Rays and Low-Energy Electrons in another window