FIGURE 4.
(a) Backscattered electron (BSE) image of etched SLM 316L substructure and (b) bright-field TEM image of dislocation structure at cell walls in SLM 316L. Reprinted with permission from Saeidi, et al.52
(a) Backscattered electron (BSE) image of etched SLM 316L substructure and (b) bright-field TEM image of dislocation structure at cell walls in SLM 316L. Reprinted with permission from Saeidi, et al.52
