FIGURE 4.
![SEM image (CBS) mode and elemental EDS mapping of the selected IMP of Al-Si9-Cu3 (SEM image in Figure 3[i]). SEM and EDS analyses of elemental mapping were made at 15 kV.](https://allen.silverchair-cdn.com/allen/content_public/journal/corrosion/79/2/10.5006_4205/2/i0010-9312-79-2-4205-f04.jpeg?Expires=1716992435&Signature=qV4-BVDHrNGLuhceA~H57AjOCppzmUUNbhmVIwBghTcfbvAo2xXpvrvr7qlje1ofePNvBCOd-FXkSJfXetGJeQ8XovNKtGTFSshOGc~PlqCSzoYzMOFbIkETSfEEIBA4BRzgjgS5SKLq6u43PJxlTWon6JPQksA2JiyVo7Liv6WbLDR27Tjtoudpt14TmXBoaCud8BH428x4pheRcK1M0dFpDPsnzz3sUpvHoZy36CWMoI3a2Voh~VfxI2fkwOpfeFGql17qkElNG9YA3jfTE0HrBKnXAqbLDPhoePIfw6q967D5yUxTGlENTn5nbSLVaLJskuQPoyIPGWHzeaVQxg__&Key-Pair-Id=APKAIE5G5CRDK6RD3PGA)
SEM image (CBS) mode and elemental EDS mapping of the selected IMP of Al-Si9-Cu3 (SEM image in Figure 3[i]). SEM and EDS analyses of elemental mapping were made at 15 kV.
SEM image (CBS) mode and elemental EDS mapping of the selected IMP of Al-Si9-Cu3 (SEM image in Figure 3[i]). SEM and EDS analyses of elemental mapping were made at 15 kV.
