(a) SEM (CBS mode) images of the microstructure of Al-Si7-Mg0.3 with six representative types of IMPs numbered 1′ to 6′. IMPS are detailed in (b) through (g). EDS analysis was made on the numbered sites 1 to 19; the results are presented in Table 4. For the intermetallic particle presented in (g), the EDS mapping is presented in Figure 6. SEM and EDS analyses were made at 15 kV.