Allen Press

$Figures 3–4. Figure 3. Backscatter scanning electron microscope (SEM) micrographs of an etched implant placed using an undersized approach. (a) Overview at magnification ×25. Note the intimate apposition of bone trabeculae to the implant surface. (b) Higher magnification (×150) of the threaded area. The fracture caused by mechanical testing occurred at the implant-bone interface (black line). Bone can be seen in close apposition to the implant surface. (c) Higher magnification (×400) of the flat implant part. Again, the fracture line induced by the torque testing can be clearly recognized. Also, at the flat implant part a tight implant-bone contact existed. Figure 4. Backscatter SEM micrograph of a machined implant placed by the osteotome approach (original magnification ×25). Bone is growing into the screw-threads and is in close contact with the flat implant part$

Figures 3–4. Figure 3. Backscatter scanning electron microscope (SEM) micrographs of an etched implant placed using an undersized approach. (a) Overview at magnification ×25. Note the intimate apposition of bone trabeculae to the implant surface. (b) Higher magnification (×150) of the threaded area. The fracture caused by mechanical testing occurred at the implant-bone interface (black line). Bone can be seen in close apposition to the implant surface. (c) Higher magnification (×400) of the flat implant part. Again, the fracture line induced by the torque testing can be clearly recognized. Also, at the flat implant part a tight implant-bone contact existed. Figure 4. Backscatter SEM micrograph of a machined implant placed by the osteotome approach (original magnification ×25). Bone is growing into the screw-threads and is in close contact with the flat implant part

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